Metallographic microscope fracture analysis technology
1. Kev soj ntsuam txoj kev ntawm metallographic microscope
Lub hauv paus ntsiab lus ntawm metallographic microscope siv nyob rau hauv cov ntaub ntawv kev tshawb fawb yog los soj ntsuam lub xeev saum npoo ntawm ib yam khoom los ntawm reflecting lub teeb los ntawm qhov chaw ntawm tus qauv. Vim muaj qhov sib txawv ntawm cov qauv microstructure, cov qauv siv lead ua, cov tshuaj muaj pes tsawg leeg, thiab qhov roughness ntawm cov khoom nto, qhov kev xav ntawm lub teeb sib txawv, uas ua rau muaj kev tsim cov hauv ob sab phlu raws li qhia hauv daim duab 3-5.
Qhov kawg daws teeb meem ntawm lub tshuab tsom iav qhov muag yog txwv los ntawm lub wavelength ntawm pom lub teeb thiab feem ntau tuaj yeem txiav txim siab los ntawm Payleigh cov txheej txheem, uas yog d=0.61 λ/(N • A)
Hauv cov qauv: d yog qhov kev daws teeb meem;
λ yog lub wavelength ntawm pom lub teeb
N. A yog tus lej aperture.
Yog tias cov lim dej ntsuab siv rau hauv lub tshuab ntsuas metallographic, tus nqi k tuaj yeem kwv yees li sib npaug ntawm {{{0}}}.5 μ m, thiab rau cov lej loj dua uas tso cai rau cov lej apertures nrog N · A ntawm 1.4, nws ua tsis tau. kom paub qhov txawv cov qauv zoo me dua 0.2 μ m. Vim muaj qhov tsis zoo ntawm qhov tsis zoo ntawm qhov tsis tshua muaj qhov loj me thiab qhov tob qhov tob, cov qauv ntawm cov kab hluav taws xob optical microscopes raug txwv rau cov pob txha tawg, thaum cov pob txha tawg tawv tawv nrog cov undulations loj tsis tuaj yeem soj ntsuam thiab tshuaj xyuas siv optical microscopes.
Hauv kev tsom xam tsis ua haujlwm tawg, metallographic microscopy tsuas yog siv los saib xyuas cov khoom siv microstructure thiab cov kab mob ntawm cov kab nrib pleb, uas yog nyob rau thaj tsam ntawm metallographic tsom xam thiab yuav tsis piav qhia ntawm no. Thaum soj ntsuam cov kab nrib pleb, nws tsis yog tsuas yog yuav tsum tau soj ntsuam thiab txheeb xyuas cov yam ntxwv morphological, kev taw qhia, cov khoom, thiab qhov pib thiab qhov kawg ntawm qhov tawg ntawm nws tus kheej, tab sis kuj yuav tsum saib xyuas thiab txheeb xyuas qhov xwm txheej nyob ib puag ncig qhov tawg thiab lub cev ib txwm muaj, kev hloov pauv hauv microhardness ntawm ob sab ntawm qhov tawg, kev faib tawm ntawm kev suav nrog, thiab cov yam ntxwv morphological ntawm oxides lossis cov khoom siv corrosion hauv qhov tawg.
Tsis ntev los no, kev vam meej tshiab tau ua tiav hauv daim ntawv thov ntawm optical microscopy los soj ntsuam cov ceg, nrog rau qhov tshwm sim ntawm hom tshiab ntawm optical microscopes nrog confocal pan lo ntsiab muag; Tsis tas li ntawd, cov tshuab yas carbon replication tuaj yeem siv los soj ntsuam qhov tawg morphology nyob rau hauv optical microscopy.
2. Cov cuab yeej kho qhov muag tseem ceeb siv
Cov cuab yeej siv hauv metallographic microscope fracture analysis technology feem ntau suav nrog cov cuab yeej kho qhov muag xws li metallographic microscope thiab stereo microscope nrog dual lo ntsiab muag.
Vim qhov tob tob ntawm kev tsom xam ntawm metallographic microscope, nws yuav tsum tau hais tias qhov kev kawm tawg nto yuav tsum tiaj tus, txawm tias ze rau lub dav hlau. Qhov ntawd yog hais tias, feem ntau nws tsis tuaj yeem kuaj xyuas qhov ntxhib thiab tsis sib xws ntawm cov pob txha tawg siv lub tshuab ntsuas qhov muag.
Thaum soj ntsuam cov pob txha tawg nyob rau hauv lub tshuab kuaj kab mob metallographic, qhov kev siv dav dav feem ntau yog nyob ib ncig ntawm 100 txog 500. Thaum siv kev tshuaj xyuas metallographic los kawm txog cov yam ntxwv ntawm cov pob txha tawg, nws yog ib qho tsim nyog yuav tsum tau nruab ib lub pob txha caj dab clamping ntaus ntawv ntawm lub tshuab ntsuas theem kom paub meej txog kev txiav txim siab. Kev hloov kho ntawm qhov qaij qhov txwv ntawm qhov kev soj ntsuam qhov tawg, kom qhov pom ntawm qhov tawg yog perpendicular mus rau microscopic dimming axis.
Lub undulating morphology ntawm cov pob txha tawg ua rau nws nyuaj rau kev tsom mus rau tag nrho cov duab nyob rau hauv lub metallographic microscope, uas txhais tau hais tias tsuas yog cov duab meej ntawm cov cheeb tsam me me tuaj yeem tau txais nyob rau hauv metallographic microscope. Txhawm rau kov yeej qhov teeb meem no, thaj tsam me me ntawm thaj chaw saib tuaj yeem raug xaiv nyob rau hauv x400 optical microscope ib puag ncig los thaij duab polar, thiab tom qab ntawd cov chaw tsom hauv tib daim duab saib cov duab tuaj yeem txiav tawm yam tsis tas yuav muab cov duab no. rau hauv ib daim duab raws li qhov txheeb ze ntawm txhua ntu. Txoj kev no yog qhov nyuaj heev, tab sis los ntawm kev xav ntawm kev nthuav dav kev siv cov tshuab kho qhov muag, nws tseem ua tau. Tshwj xeeb tshaj yog rau cov chav nyob uas tam sim no tsis muaj electron microscopy, nws muaj qhov tseem ceeb dua.
Lwm hom optical microscope yog ib lub tso suab tso suab paj nruag, uas feem ntau siv qhov loj ntawm xl rau x 100 thiab muaj kev nkag siab zoo ntawm lub tso suab tsis pom kev. Nws tuaj yeem ua ke nrog cov khoom siv yees duab.
Tsis ntev los no, Mclachin tau tsim kho qhov muag tsom iav nrog qhov tob ntawm kev ua kom pom tseeb, uas tuaj yeem siv los txheeb xyuas thiab kawm txog morphology ntawm microscopic puas.
