Qhov sib txawv ntawm electron microscope thiab metallography microscope
Lub hauv paus ntsiab lus ntawm Scanning Electron Microscope
Scanning ElectronMicroscope (SEM), abbreviated li SEM, yog ib tug complex system uas condenses electron-optical technology, lub tshuab nqus tsev vacuum, zoo mechanical qauv thiab niaj hnub computer tswj technology. SEM yog ib qho kev ua kom muaj zog siab ntawm cov phom hluav taws xob tawm los ntawm cov hluav taws xob los ntawm ntau theem electromagnetic lens convergence rau hauv me me ntawm cov hluav taws xob. Scanning nyob rau hauv lub specimen nto, excitation ntawm ntau yam ntaub ntawv, los ntawm kev txais cov ntaub ntawv no, amplification thiab tso saib imaging, nyob rau hauv thiaj li yuav soj ntsuam cov specimen nto. Kev sib cuam tshuam ntawm qhov xwm txheej electrons nrog cov qauv tsim ua cov ntaub ntawv qhia nyob rau hauv daim duab 1. Qhov kev faib tawm ob sab ntawm cov ntaub ntawv no txawv nrog cov yam ntxwv ntawm cov qauv saum npoo (cov yam ntxwv no yog qhov chaw morphology, muaj pes tsawg leeg, siv lead ua orientation, electromagnetic zog. , thiab lwm yam), yog ntau yam khoom siv los khaws cov ntaub ntawv hauv kev txiav txim, qhov piv ntawm cov ntaub ntawv hloov dua siab tshiab rau hauv lub teeb liab video, thiab tom qab ntawd xa mus rau tib lub sijhawm scanning ntawm cov duab raj thiab kev hloov kho ntawm nws qhov ci, koj tuaj yeem tau txais cov lus teb. mus rau saum npoo ntawm cov qauv scanning daim ntawv qhia. Yog hais tias lub teeb liab tau txais los ntawm lub ntes yog digitized thiab hloov mus rau hauv lub teeb liab digital, nws tuaj yeem ua tiav ntxiv thiab khaws cia los ntawm lub computer. Scanning electron microscopes feem ntau yog tsim los rau kev soj ntsuam ntawm cov qauv tuab tuab nrog qhov sib txawv qhov siab loj thiab qhov tsis sib xws, thiab yog li tsim los qhia txog qhov tob-ntawm-tso cov nyhuv, thiab feem ntau yog siv los txheeb xyuas cov pob txha pob txha thiab cov chaw ntuj uas tsis muaj raug kho kho.
Electron microscope thiab metallurgical microscope
Ua ntej, lub teeb pom kev sib txawv: metallurgical microscope siv lub teeb pom kev zoo li lub teeb pom kev, scanning electron microscope siv electron beam ua lub teeb pom kev zoo.
Qhov thib ob, lub hauv paus ntsiab lus yog txawv: metallurgical microscope siv geometric optics imaging txoj cai rau imaging, scanning electron microscope siv high-zog electron beam bombardment ntawm tus qauv nto, excitation ntawm ntau yam ntawm lub cev teeb liab ntawm tus qauv, thiab ces siv. ntawm cov teeb liab sib txawv detectors txais lub cev cov cim hloov dua siab tshiab rau hauv cov ntaub ntawv duab.
Qhov thib peb, qhov kev daws teeb meem sib txawv: metallurgical microscope vim muaj kev cuam tshuam thiab qhov sib txawv ntawm lub teeb, qhov kev daws teeb meem tsuas yog txwv rau 0.2-0.5um nruab nrab. Scanning electron microscope vim tias siv cov kab hluav taws xob ua lub teeb ci, qhov kev daws teeb meem tuaj yeem ncav cuag ntawm 1-3nm, yog li kev soj ntsuam cov ntaub so ntswg ntawm metallurgical microscope belongs rau qib micron tsom, scanning electron microscope cov ntaub so ntswg soj ntsuam belongs rau qib nanometer. tsom xam.
Plaub, qhov tob ntawm daim teb yog txawv: dav dav metallurgical microscope qhov tob ntawm daim teb ntawm 2-3um, yog li qhov smoothness ntawm tus qauv muaj ntau qhov kev xav tau, yog li nws cov txheej txheem sampling yog qhov nyuaj. Thaum lub scanning electron microscope muaj ib tug loj qhov tob ntawm teb, loj teb ntawm saib, imaging nplua nuj peb-dimensional kev txiav txim, tuaj yeem ncaj qha soj ntsuam ntau yam qauv ntawm qhov tsis sib xws ntawm microstructure.
